作废 SJ 2327-1983
低温试验设备通用技术条件 低温试验设备通用技术条件 Generic specification for low temperature test chambers
发布日期:1983-04-11
实施日期:1983-10-01
分类信息
标准简介

本标准规定了电工、电子产品进行低温试验所用设备的技术条件,能满足GB 2423.1-81《电工电子产品基本环境试验规程试验A:低温试验方法》对试验设备(以下简称设备)的要求

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最后更新时间 2025-08-27