VDI/VDE 2656 Sheet 1
Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
用扫描探针显微镜测定几何量.测量系统的校准
2008-06-01
KS D 2714
주사 탐침 현미경－횡방향 수평력 측정방법
扫描探针显微镜－侧向力显微镜法
2016-12-19
KS D 2714(2021 Confirm)
주사 탐침 현미경－횡방향 수평력 측정방법
扫描探针显微镜－侧向力显微镜法
2016-12-19
JJF 1916-2021
扫描电子显微镜校准规范
Calibration Specification for Scanning Electronic Microscopes (SEM)
2021-07-28
VDI/VDE 2656 Sheet 1-DRAFT
Draft Document - Determination of geometrical quantities by using of scanning probe microscopes - Calibration of measurement systems
文件草案.用扫描探针显微镜测定几何量.测量系统的校准
2006-12-01
GOST R 8.635-2007
Государственная система обеспечения единства измерений. Микроскопы сканирующие зондовые атомно-силовые. Методика калибровки
国家制度确保衡量标准的统一性 原子扫描探针显微镜 校准方法
JY/T 0582-2020
扫描探针显微镜分析方法通则
General rules of analytical methods for the scanning probe microscope
2020-09-29
GB/T 29190-2012
扫描探针显微镜漂移速率测量方法
Measurement methods of drift rate of scanning probe microscope
2012-12-31
BS ISO 27911-2011
Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
表面化学分析 扫描探针显微镜 近场光学显微镜横向分辨率的定义和校准
2011-08-31
ISO 27911-2011
Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope
表面化学分析——扫描探针显微镜——近场光学显微镜横向分辨率的定义和校准
2011-07-21
BS ISO 13083-2015
Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
表面化学分析 扫描探针显微镜 二维掺杂成像和其他用途的电子扫描探针显微镜（ESPM）空间分辨率的定义和校准标准 如SSRM和SCM
2015-08-31
GB/T 43661-2024
表面化学分析 扫描探针显微术 用于二维掺杂物成像等用途的电扫描探针显微镜（ESPM，如SSRM和SCM）空间分辨的定义和校准
Surface chemical analysis—Scanning probe microscopy—Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
2024-03-15
ISO 13083-2015
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
表面化学分析.扫描探针显微镜.用于2D掺杂成像和其他目的的电扫描探针显微镜（ESPM）的空间分辨率定义和校准标准 如SSRM和SCM
2015-08-20
ASTM E766-14(2019)
Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
校准扫描电子显微镜的放大倍数的标准实施规程
2019-11-01
BS 10/30165036 DC
BS ISO 27911. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
BS ISO 27911 表面化学分析 扫描探针显微镜 近场光学显微镜横向分辨率的定义和校准
2010-07-20
GOST R 8.630-2007
Государственная система обеспечения единства измерений. Микроскопы сканирующие зондовые атомно-силовые. Методика поверки
确保测量一致性的状态系统 原子力扫描探针显微镜 验证方法
GOST 8.593-2009
Государственная система обеспечения единства измерений. Микроскопы сканирующие зондовые атомно-силовые. Методика поверки
确保测量一致性的状态系统 原子力扫描探针显微镜 验证方法
2009-11-11
JJF 1402-2013
生物显微镜校准规范
Calibration Specification for Biological Microscopes
2013-04-27
JJF 1914-2021
金相显微镜校准规范
Calibration Specification for Metallurgical Microscopes
2021-07-28
GOST R ISO 27911-2015
Государственная система обеспечения единства измерений. Химический анализ поверхности. Сканирующая зондовая микроскопия. Определение и калибровка латерального разрешения ближнепольного оптического микроскопа
确保测量一致性的状态系统 表面化学分析 扫描探针显微镜 近场光学显微镜的横向分辨率的定义和校准