JB/T 6307.3-1992
电力半导体模块测试方法整流管三相桥
Test method for power semiconductor module Triphase bridge rectifier diode
1992-06-26
JB/T 6307.2-1992
电力半导体模块测试方法整流管单相桥
Test method for power semiconductor module Single-phase bridge rectifier diodes
1992-06-26
GOST 19656.2-1974
Диоды полупроводниковые СВЧ смесительные. Метод измерения выпрямленного тока
半导体UHF混频二极管 整流电流的测量方法
GOST 18986.16-1972
Диоды полупроводниковые выпрямительные. Методы измерения среднего значения прямого напряжения и среднего значения обратного тока
整流二极管 测量平均正向电压和平均反向电流的方法
GB/T 20114-2019
普通电源或整流电源供电直流电机的特殊试验方法
Specific test methods for d.c.machines on conventional and rectifier-fed supplies
2019-06-04
JB/T 5845-1991
高压静电除尘用整流设备试验方法
Test method of rectifier units of high voltage static dedusting devices
1991-10-24
KS C 6906(2016 Confirm)
광 전송용 레이저 다이오드 시험 방법
激光二极管用于光纤传输测试方法
2001-03-20
KS C 6906(2021 Confirm)
광 전송용 레이저 다이오드 시험 방법
光纤传输用激光二极管的试验方法
2001-03-20
GB/T 36613-2018
发光二极管芯片点测方法
Probe test method for light emitting diode chips
2018-09-17
BS IEC 60747-5-8-2019
Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
半导体器件
2019-11-27
KS C 6943(2019 Confirm)
광 전송용 반도체 레이저 모듈 측정방법
激光二极管模块的用于光纤传输测试方法
2014-12-31
KS C 5301(2017 Confirm)
광전송용 발광 다이오드 시험 방법
发光二极管用于光纤传输测试方法
1992-12-17
KS C 5301(2022 Confirm)
광전송용 발광 다이오드 시험 방법
光纤传输用发光二极管的试验方法
1992-12-17
KS C 6943(2024 Confirm)
광 전송용 반도체 레이저 모듈 측정방법
激光二极管模块的用于光纤传输测试方法
2014-12-31
SN/T 3723-2013
装有激光器和发光二极管玩具辐射的检测方法
Test method of radiation of laser and light emitting diode in toys
2013-11-06
GB/T 38621-2020
发光二极管模块热特性瞬态测试方法
Transient thermal test method for light emitting diode modules
2020-04-28
BS IEC 60747-5-11-2019
Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
半导体器件
2020-01-14
MIL MIL-STD-750-4
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 through 4999
半导体器件二极管电气试验方法第4部分:试验方法4000至4999
2012-01-03
MIL MIL-STD-750-4 w/Change 3
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 through 4999
半导体器件的二极管电气试验方法第4部分:试验方法4000-499
2019-12-30
MIL MIL-STD-750-4 Change 1
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 through 4999
半导体器件的二极管电气试验方法第4部分:试验方法4000-499
2014-08-15