半绝缘碳化硅单晶的电阻率非接触测试方法
Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement
2022-12-30
SJ/T 11488-2015
半绝缘砷化镓电阻率、霍尔系数和迁移率测试方法
Test method for measuring resistivity,hall coefficient and determining hall mobility in semi-insulating GaAs single crystals
2015-04-30
UNE 20606-2/2C-1986
ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT; BASIC TESTING PROCEDURES AND MEASURING METHODS. GENERAL EXAMINATION, ELECTRICAL CONTINUITY AND CONTACT RESISTANCE TESTS, INSULATION TESTS AND VOLTAGE STRESS TESTS
电子设备用机电元件；基本测试程序和测量方法 一般检查、电气连续性和接触电阻测试、绝缘测试和电压应力测试
1986-03-15
DIN/IEC 60512-2 Amendment 1
Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY
电子设备用机电元件.基本试验程序和测量方法.第2部分:一般检查 电气连续性和接触电阻试验 绝缘试验和电压应力试验.仅限德语
1995-08-01
DIN/IEC 60512-2
Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY
电子设备用机电元件；基本测试程序和测量方法；第2部分:一般检查、电气连续性和接触电阻试验、绝缘试验和电压应力试验-仅德语版