SJ 21147.3-2016
军用集成电路电磁发射测量方法 第3部分:辐射发射测量-表面扫描法
Measurement of electromagnetic emissions for military integrated circuits - Part 3:Measurement of radiated emissions - Surface scan method
2016-01-19
SJ 21147.1-2016
军用集成电路电磁发射测量方法 第1部分:通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions
2016-01-19
SJ 21147.5-2016
军用集成电路电磁发射测量方法 第5部分:传导发射测量-工作台法拉第笼法
Measurement of electromagnetic emissions for military integrated circuits - Part 5:Measurement of conducted emissions - Workbench Faraday Cage method
2016-01-19
SJ 21147.4-2016
军用集成电路电磁发射测量方法 第4部分:传导发射测量-1Ω/150Ω直接耦合法
Measurement of electromagnetic emissions for military integrated circuits - Part 4:Measurement of conducted emissions - 1Ω/150Ω direct coupling method
2016-01-19
BS EN IEC 61967-1-2019
Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义
2019-02-21
IEC TS 61967-3-2014
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法
2014-08-25
IEC 61967-8-2023 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
IEC 61967-8-2023
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法
2023-05-03
BS EN IEC 61967-4-2021
Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
集成电路 电磁辐射测量
2021-05-06
GB/T 44937.4-2024
集成电路 电磁发射测量 第4部分：传导发射测量 1Ω/150Ω直接耦合法
Integrated circuits—Measurement of electromagnetic emissions—Part 4: Measurement of conducted emissions—1Ω/150Ω direct coupling method
2024-12-31
IEC 61967-1-2018
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义
2018-12-12
IEC 61967-1-2018 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义
2018-12-12
BS EN 61967-5-2003
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz
2003-06-17
IEC 61967-4-2021 RLV
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法
2021-03-16
IEC 61967-6-2002+AMD1-2008 CSV
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法
2008-06-24
IEC 61967-6-2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法
2002-06-25
IEC 61967-4-2021
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射
2021-03-16
DIN IEC/TS 61967-3
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法（IEC/TS 61967-3-2014）
2015-08-01
BS EN 61967-2-2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
集成电路 电磁辐射测量 150 kHz至1 GHz
2006-01-23
KS C IEC 61967-4(2024 Confirm)
집적회로 — 150 kHz에서 1 GHz까지의 전기자기적 방출 측정 — 제4부: 수행된 방출 측정 — 1 /150 직접결합방법
集成电路 150 kHz至1 GHz电磁发射的测量 第4部分:传导发射的测量 1 Ω/150 Ω直接耦合法
2004-11-30