半导体红外发射二极管测量方法 第1部分：总则
Measuring method for semiconductor infrared-emitting diode - Part 1:General
2015-10-10
SJ/T 2658.2-2015
半导体红外发射二极管测量方法 第2部分:正向电压
Measuring method for semiconductor infrared-emitting diode - Part 2:Forward voltage
2015-10-10
SJ/T 2658.11-2015
半导体红外发射二极管测量方法 第11部分:响应时间
Measuring method for semiconductor infrared-emitting diode - Part 11:Response time
2015-10-10
SJ/T 2658.6-2015
半导体红外发射二极管测量方法 第6部分:辐射功率
Measuring method for semiconductor infrared-emitting diode - Part 6:Radiant power
2015-10-10
SJ/T 2658.8-2015
半导体红外发射二极管测量方法 第8部分：辐射强度
Measuring method for semiconductor infrared-emitting diode - Part 8:Radiant intensity
2015-10-10
SJ/T 2658.10-2015
半导体红外发射二极管测量方法 第10部分：调制带宽
Measuring method for semiconductor infrared-emitting diode - Part 10:Modulation bandwidth
2015-10-10
SJ/T 2658.7-2015
半导体红外发射二极管测量方法 第7部分：辐射通量
Measuring method for semiconductor infrared-emitting diode - Part 7:Radiant flux
2015-10-10
SJ/T 2658.15-2016
半导体红外发射二极管测量方法 第15部分：热阻
Measuring method for semiconductor infrared-emitting diode - Part 15:Thermal resistance
2016-01-15
SJ/T 2658.4-2015
半导体红外发射二极管测量方法 第4部分：总电容
Measuring method for semiconductor infrared-emitting diode - Part 4:Total capacitance
2015-10-10
SJ/T 2658.5-2015
半导体红外发射二极管测量方法 第5部分:串联电阻
Measuring method for semiconductor infrared-emitting diode - Part 5:Series connection resistance
2015-10-10
SJ/T 2658.13-2015
半导体红外发射二极管测量方法 第13部分:辐射功率温度系数
Measuring method for semiconductor infrared-emitting diode - Part 13:Temperature coefficient for radiant power
2015-10-10
SJ/T 2658.3-2015
半导体红外发射二极管测量方法 第3部分：反向电压和反向电流
Measuring method for semiconductor infrared-emitting diode - Part 3:Reverse voltage and reverse current
2015-10-10
SJ/T 2658.16-2016
半导体红外发射二极管测量方法 第16部分：光电转换效率
Measuring method for semiconductor infrared-emitting diode - Part 16:Photo-electric conversion efficiency
2016-01-15
SJ/T 2658.12-2015
半导体红外发射二极管测量方法 第12部分：峰值发射波长和光谱辐射带宽
Measuring method for semiconductor infrared-emitting diode - Part 12:Peak-emission wavelength and spectral radiant bandwidth
2015-10-10
SJ/T 2658.9-2015
半导体红外发射二极管测量方法 第9部分：辐射强度空间分布和半强度角
Measuring method for semiconductor infrared-emitting diode - Part 9:Spatial distribution of radiant intensity and half-intensity angle
2015-10-10
IEC 60747-5-14-2022
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
半导体器件第5-14部分:光电子器件发光二极管基于热反射法的表面温度试验方法