集成电路 电磁抗扰度测量 第2部分：辐射抗扰度测量 TEM小室和宽带TEM小室法
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
2024-10-26
SJ 21147.2-2016
军用集成电路电磁发射测量方法 第2部分:辐射发射测量-TEM小室和宽带TEM小室法
Measurement of electromagnetic emissions for military integrated circuits - Part 2:Measurement of radiated emissions - TEM cell and wideband TEM cell method
2016-01-19
DIN EN 62132-2
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
集成电路.电磁抗扰度测量.第2部分:辐射抗扰度测量.TEM室和宽带TEM室法（IEC 62132-2-2010）；德文版EN 62132-2:2011
2011-07-01
DIN IEC 62132-2-DRAFT
Draft Document - Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
文件草稿.集成电路.150 kHz至1 GHz电磁抗扰度的测量.第2部分:辐射抗扰度的测量.Tem室和宽带Tem室法（IEC 47A/748/CD:2006）
2006-08-01
BS 06/30151320 DC
BS IEC 62132-2. Integrated Circuits, Measurement of Electro magnetic Immunity, 150 kHz to 1 GHz. Part 2. Measurement of Radiated Immunity Tem-Cell and Wideband Tem-Cell Method
BS IEC 62132-2 集成电路 电磁抗扰度的测量 150kHz至1GHz 第二部分 辐射抗扰度的测量Tem室法和宽带Tem室法
2006-06-09
IEC 62132-2-2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
集成电路 - 电磁抗扰度测量 - 第2部分:辐射抗扰度测量 - 温度计和宽带电池法