QX/T 558-2020
气候指数 低温
Climate index—Low temperature
2020-06-16
GB/T 21985-2008
主要农作物高温危害温度指标
Temperature index of high temperature harm for main crops
2008-06-03
BS EN 60749-6-2017
Semiconductor devices. Mechanical and climatic test methods-Storage at high temperature
半导体器件 机械和气候试验方法
2017-11-24
BS EN 60749-23-2004+A1-2011
Semiconductor devices. Mechanical and climatic test methods-High temperature operating life
半导体器件 机械和气候试验方法
2011-06-30
UNE-EN 60749-6-2003
Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature.
半导体器件.机械和气候试验方法.第6部分:高温贮存
2003-05-30
KS C IEC 60749-6
반도체 소자 — 기계 및 기후적 환경 시험방법 — 제6부: 고온에서의 저장
半导体器件 - 机械和气候测试方法 - 第6部分:高温储存
2020-07-23
IEC 60749-6-2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
半导体器件.机械和气候试验方法.第6部分:高温储存
2017-03-03
UNE-EN 60749-23-2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
半导体器件机械和气候试验方法第23部分:高温工作寿命
2005-03-16
KS C IEC 60749-23(2016 Confirm)
반도체 소자－기계 및 기후적 환경 시험 방법－제23부：고온 동작 수명
半导体器件机械和气候试验方法第23部分:高温工作寿命
2006-03-24
KS C IEC 60749-23
반도체소자 — 기계 및 기후 시험방법 — 제23부: 고온 동작 수명
半导体器件.机械和气候试验方法.第23部分:高温工作寿命
2021-12-29
GB/T 4937.23-2023
半导体器件 机械和气候试验方法 第23部分：高温工作寿命
Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
2023-05-23
IEC 60749-23-2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
半导体器件 - 机械和气候测试方法 - 第23部分:高温工作寿命
2004-02-23
IEC 60749-23-2004+AMD1-2011 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
半导体器件.机械和气候试验方法.第23部分:高温工作寿命
2011-03-30
SJ/T 10212-1991
Y60600-G高低温低气压试验设备
Climate testing equipment--High and low temperature/Low air pressure test equipment for Type Y60600-G
1991-05-28
IEC 60749-23-2004/AMD1-2011
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
修改件1.半导体器件.机械和气候试验方法.第23部分:高温工作寿命
2011-01-27
BS EN 60317-49-2012
Specifications for particular types of winding wires-Glass-fibre wound high temperature resin or varnish impregnated, bare or enamelled round copper wire, temperature index 180
特殊类型绕组线的规范 玻璃纤维缠绕高温树脂或清漆浸渍裸铜线或漆包圆铜线 温度指数180
2013-04-30
IEC 60317-49-2012
Specifications for particular types of winding wires - Part 49: Glass-fibre wound high temperature resin or varnish impregnated, bare or enamelled round copper wire, temperature index 180
导线特殊规格规范 - 第49部分:玻璃纤维缠绕高温树脂或清漆浸渍 裸线或漆包铜线 温度指数180
2012-07-09
BS 11/30247695 DC
BS EN 60317-49. Specifications for particular types of winding wires. Part 49. Glass-fibre wound high temperature resin or varnish impregnated, bare or enamelled round copper wire, temperature index 180
英国标准EN 60317-49 特殊类型绕组线的规范 第49部分 玻璃纤维缠绕高温树脂或清漆浸渍裸铜线或漆包圆铜线 温度指数180
2011-05-19