SY/T 5162-2021
岩石样品扫描电子显微镜分析方法
Analytical method for rock samples by scanning electron microscope
2021-11-16
JY/T 0584-2020
扫描电子显微镜分析方法通则
General rules of analytical methods for scanning electron microscope
2020-09-29
GB/T 18295-2001
油气储层砂岩样品 扫描电子显微镜分析方法
Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
2001-01-10
GB/T 33834-2017
微束分析 扫描电子显微术 生物试样扫描电子显微镜分析方法
Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
2017-05-31
KS D ISO 22493(2017 Confirm)
마이크로빔 분석－주사전자현미경－용어
微束分析扫描电子显微镜词汇
2012-12-07
BS ISO 22493-2014
Microbeam analysis. Scanning electron microscopy. Vocabulary
微束分析 扫描电子显微镜 词汇
2014-04-30
KS D ISO 22493
마이크로빔 분석 —주사전자현미경 — 용어
微束分析.扫描电子显微镜.词汇
2022-08-22
ISO 22493-2014
Microbeam analysis — Scanning electron microscopy — Vocabulary
微束分析——扫描电子显微镜——词汇
2014-04-09
JJG(教委) 010-1996
分析型扫描电子显微镜检定规程
Verification regulation for analytical scanning electron microscope
1997-01-23
JJG (教委) 010-1996
分析型扫描电子显微镜检定规程
Verification Regulation for analytical scanning electron microscope
DB31/T 297-2003
扫描电子显微镜放大倍率校准方法
2003-10-28
JY/T 0581-2020
透射电子显微镜分析方法通则
General analysis rules for transmission electron microscope
2020-09-29
ISO/TS 24597-2011
Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
微束分析——扫描电子显微镜——图像清晰度的评价方法
2011-06-07
ISO 19214-2024
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
微束分析 分析电子显微镜 用透射电子显微镜测定纳米晶体表观生长方向的方法
2024-10-16
KS D ISO 16700(2018 Confirm)
마이크로빔 분석－주사전자현미경－영상 배율 교정 지침
微束分析－扫描电子显微镜－图像放大率校准指南
2013-06-05
KS D ISO 16700
마이크로빔 분석 — 주사전자현미경 — 영상 배율 교정 지침
微束分析扫描电子显微镜图像放大率校准指南
2023-11-20
BS ISO 21466-2019
Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
微束分析 扫描电子显微镜 用CDSEM评估临界尺寸的方法
2019-12-18
JIS R 1633-1998
Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation
用于扫描电子显微镜观察的精细陶瓷和精细陶瓷粉末样品制备方法
1998-01-01
BS ISO 16700-2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
微束分析 扫描电子显微镜 校准图像放大率的指南
2016-07-31
ISO 16700-2016
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
微束分析 - 扫描电子显微镜 - 校准图像放大率的指南
2016-07-18