KS D ISO 16700(2018 Confirm)
마이크로빔 분석－주사전자현미경－영상 배율 교정 지침
微束分析－扫描电子显微镜－图像放大率校准指南
2013-06-05
KS D ISO 16700
마이크로빔 분석 — 주사전자현미경 — 영상 배율 교정 지침
微束分析扫描电子显微镜图像放大率校准指南
2023-11-20
T/CSTM 00162-2020
透射电子显微镜校准方法
2020-03-23
BS ISO 16700-2016
Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
微束分析 扫描电子显微镜 校准图像放大率的指南
2016-07-31
ISO 16700-2016
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
微束分析 - 扫描电子显微镜 - 校准图像放大率的指南
2016-07-18
JY/T 0581-2020
透射电子显微镜分析方法通则
General analysis rules for transmission electron microscope
2020-09-29
ISO 29301-2023
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
微束分析分析分析电子显微镜用周期结构参考材料校准图像放大率的方法
2023-10-16
ISO 19214-2024
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
微束分析 分析电子显微镜 用透射电子显微镜测定纳米晶体表观生长方向的方法
2024-10-16
GB/T 21637-2008
冠状病毒透射电子显微镜形态学鉴定方法
Method of morphological identification of coronavirus by using transmission electron microscopy
2008-04-11
GB/T 28044-2011
纳米材料生物效应的透射电子显微镜检测方法通则
General guide of detection method for nanomaterial biological effect by transmission electron microscope (TEM)
2011-10-31
GB/T 34331-2017
黄瓜绿斑驳花叶病毒透射电子显微镜检测方法
Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
2017-10-14
GB/T 34168-2017
金、银纳米颗粒材料生物效应的透射电子显微镜检测方法
Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope
2017-09-07
GB/Z 21738-2008
一维纳米材料的基本结构 高分辨透射电子显微镜检测方法
Fundamental structures of one dimensional nanomaterials - High resolution electron microscopy characterization
2008-05-08
GB/T 33839-2017
基于生物效应含碳基纳米材料生物样品的透射电子显微镜检测方法
Methods of transmission electron microscope for biological specimen containing carbon nanomaterials involving biological effect
2017-05-31
GB/T 44558-2024
III族氮化物半导体材料中位错成像的测试 透射电子显微镜法
Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy
2024-09-29
JIS K 3850-2-2000
Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
空气中纤维颗粒的测量方法第2部分:直接转移透射电子显微镜法
2000-01-01
JIS K 3850-4-2000
Measuring method for airborne fibrous particles -- Part 4: Indirect-transfer transmission electron microscopy method
空气中纤维颗粒的测量方法第4部分:间接转移透射电子显微镜法
2000-01-01
JIS K 3850-3-2000
Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
空气中纤维颗粒的测量方法第3部分:间接转移透射电子显微镜法
2000-01-01
ISO 20263-2024
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
微束分析 - 分析透射电子显微镜 - 分层材料横截面图像中界面位置的测定方法
2024-11-06
GOST R 8.697-2010
Государственная система обеспечения единства измерений. Межплоскостные расстояния в кристаллах. Методика выполнения измерений с помощью просвечивающего электронного микроскопа
确保测量一致性的状态系统 晶体间隔 通过透射电子显微镜测量的方法