SJ/T 9533-1993 半导体分立器件质量分等标准

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
电子元件质量评定协调体系 分立半导体器件 分规范

2010-01-31

Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
电子元件质量评定协调体系 总规范:分立半导体器件

1987-10-30

Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
电子元件质量评定协调体系 分立半导体器件 分规范

1986-12-31

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
半导体器件的机械标准化 - 第1部分:分立器件外形图准备的一般规则

2018-01-23

Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
电子元件质量评定协调体系 总规范:离散压力接触功率半导体器件（资格认证）

1998-07-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 开关用双极晶体管

1991-11-15

IEC 60191-1 ED.2. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
IEC 60191-1第2版 半导体器件的机械标准化 第一部分 分立器件外形图绘制通则

2005-02-09

Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
电子元件质量评定协调体系 半导体器件 离散设备 场效应晶体管 开关用外壳额定场效应晶体管空白详细规范

1996-12-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 信号二极管、开关二极管和受控雪崩二极管

1986-11-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于高频放大的外壳额定双极晶体管

1991-11-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频放大的外壳额定双极晶体管

1990-02-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于外壳额定功率放大器应用的场效应晶体管

1993-07-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频和高频放大的环境额定双极晶体管

1990-02-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 反向阻断三极晶闸管 环境和外壳额定 高达100 A

1990-02-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 双向三极晶闸管（TRIAC） 环境或外壳额定 高达100 A

1992-01-31

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (IEC 60191-1:2018); German version EN IEC 60191-1:2018
半导体器件的机械标准化.第1部分:分立器件外形图绘制的一般规则（IEC 60191-1-2018）；德国版本EN IEC 60191-1:2018

2018-10-01

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 整流二极管（包括雪崩整流二极管） 环境和外壳额定 高达100 A

1990-02-15

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 电压调节器二极管和电压参考二极管 不包括温度补偿精密参考二极管

1987-09-15

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
电子元件质量评定协调体系规范 空白详细规范 半导体器件 离散设备 场效应晶体管 5W和1GHz以下单栅场效应晶体管空白详细规范

1988-12-15

IEC 62149-3-4. Basic standards for discrete/integrated optoelectronic semiconductor devices for fibre optic communications including hybrid devices. Part 3-4. Package interface standards. Interface standard for SC-SIP 9 pin fibre optic terminal device (IEC Document 86C/294/CDV)
IEC 62149-3-4 光纤通信用分立/集成光电半导体器件基本标准 包括混合器件 第3-4部分 软件包接口标准 SC-SIP 9针光纤终端设备的接口标准（IEC文件86C/294/CDV）

2000-09-25