GB/T 35158-2017
俄歇电子能谱仪检定方法
Verification method for Auger electron spectrometers(AES)
2017-12-29
SJ 21626-2021
氮化镓材料元素化学计算比的俄歇能谱测试方法
ISO 17973-2024
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
表面化学分析中分辨俄歇电子能谱仪元素分析能标的校准
2024-07-03
KS D ISO 17973(2016 Confirm)
표면 화학 분석－중분해능 오제 전자 분광기－원소 분석을 위한 에너지 눈금 교정
表面化学分析中分辨率俄歇电子能谱仪元素分析用能标的校准
2011-12-30
GB/T 29732-2021
表面化学分析 中等分辨俄歇电子能谱仪 元素分析用能量标校准
Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
2021-12-31
GB/T 29731-2013
表面化学分析 高分辨俄歇电子能谱仪 元素和化学态分析用能量标校准
Surface chemical analysis - High resolution auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
2013-09-18
KS D ISO 17974(2016 Confirm)
표면 화학 분석－고분해능 오제 전자 분광기－원소 및 화학 상태 분석을 위한 에너지 눈금 교정
表面化学分析高分辨率俄歇电子能谱仪元素和化学状态分析用能标的校准
2011-12-30
GB/T 28893-2024
表面化学分析 俄歇电子能谱和X射线光电子能谱 测定峰强度的方法和报告结果所需的信息
Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Methods used to determine peak intensities and information required when reporting results
2024-03-15
BS ISO 29081-2010
Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction
表面化学分析 俄歇电子能谱 报告用于充电控制和充电校正的方法
2010-02-28
ISO 29081-2010
Surface chemical analysis — Auger electron spectroscopy — Reporting of methods used for charge control and charge correction
表面化学分析——俄歇电子能谱；报告用于充电控制和充电校正的方法
2010-02-05
BS ISO 20903-2019
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
表面化学分析 俄歇电子能谱和X射线光电子能谱 报告结果时用于确定峰值强度和所需信息的方法
2019-02-15
GB/T 32998-2016
表面化学分析 俄歇电子能谱 荷电控制与校正方法报告的规范要求
Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction
2016-10-13
ISO 17974-2002
Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis
表面化学分析——高分辨率俄歇电子能谱仪——元素和化学状态分析用能量标度的校准
2002-10-17
ISO 17109-2022
Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
表面化学分析.深度剖面.用单层和多层薄膜在X射线光电子能谱、俄歇电子能谱和二次离子质谱中测定溅射速率的方法
2022-03-01
GB/T 41064-2021
表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法
Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
2021-12-31
ISO 20903-2019
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
表面化学分析 - 俄歇电子光谱和X射线光电子能谱 - 用于确定峰值强度的方法和报告结果时所需的信息
2019-02-13