GOST 19300-1986
Средства измерений шероховатости поверхности профильным методом. Профилографы-профилометры контактные. Типы и основные параметры
通过轮廓法测量表面粗糙度的仪器 接触轮廓仪和轮廓仪 类型和主要参数
ISO 13473-3-2002
Characterization of pavement texture by use of surface profiles — Part 3: Specification and classification of profilometers
用表面轮廓仪表征路面结构第3部分:轮廓仪的规范和分类
2002-11-08
JJF(津) 3012-2021
触针式电动轮廓仪校准规范
2021-04-16
KS D ISO 4518(2017 Confirm)
금속 피막－도금 두께 측정－프로파일 미터법
金属涂层 - 涂层厚度的测量 - 轮廓仪法
2012-11-10
ASTM E2955-13(2019)
Standard Practice for Simulating Profilograph Response to Longitudinal Profiles of Traveled Surfaces
模拟行驶表面纵向轮廓响应的轮廓仪的标准实施规程
2019-12-01
VDI/VDE 2602
Roughness measurement with electric contact (stylus) profile meters
用电接触（触针）轮廓仪测量粗糙度
1983-09-01
GB/T 11378-2005
金属覆盖层 覆盖层厚度测量 轮廓仪法
Metallic coatings-Measurement of coating thickness-Profilometric method
2005-06-23
DIN ISO 13473-3
Characterization of pavement texture by use of surface profiles - Part 3: Specifications and classification of profilometers (ISO 13473-3:2002)
用表面轮廓表征路面结构第3部分:轮廓仪的规范和分类
2004-07-01
FED GG-P-001278A
PLASTIC-FILLING INTRUMENTS AND CONTOURING INSTRUMENT, DENTAL (S/S BY A-A-53507)
牙科塑料填充器械和轮廓仪（S/S由A-A-53507提供）
1970-01-02
ASTM E1274-18(2024)
Standard Test Method for Measuring Pavement Roughness Using a Profilograph
用轮廓仪测量路面粗糙度的标准试验方法
2024-05-01
GB/T 33826-2017
玻璃衬底上纳米薄膜厚度测量 触针式轮廓仪法
Measurement of nanofilm thickness on glass substrate—Profilometric method
2017-05-31
KS F 2373(2020 Confirm)
7.6 m 프로파일미터에 의한 포장의 평탄성 시험방법
用7.6米轮廓仪测量路面粗糙度的标准试验方法
2010-12-30
CID A-A-53507
PLUGGER, PLASTIC FILLING, DENTAL CONTOURING INSTRUMENT, MATRIX, DENTAL (SUPERSEDING GG-P-001278A)
牙科用牙体轮廓仪塑料充填器基质（替代GG-P-001278A）
1991-01-28
ISO/PAS 13473-6-2021
Characterization of pavement texture by use of surface profiles — Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
用表面轮廓表征路面结构.第6部分:路面结构测量用激光轮廓仪性能的验证
2021-11-02
JIS R 1636-1998
Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
GB/T-精细陶瓷薄膜厚度试验方法接触探针轮廓仪测量薄膜厚度
1998-01-01
BS EN ISO 18452-2016
Fine ceramics (advanced ceramics, advanced technical ceramics). Determination of thickness of ceramic films by contact-probe profilometer
精细陶瓷（高级陶瓷、高级工业陶瓷） 用接触探针轮廓仪测定陶瓷膜厚度
2016-04-30
ISO 18452-2005
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
精细陶瓷（高级陶瓷、高级工业陶瓷）——用接触探针轮廓仪测定陶瓷膜厚度
2005-11-16
GB/T 32999-2016
表面化学分析 深度剖析 用机械轮廓仪栅网复型法测量溅射速率
Surface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
2016-10-13
DIN EN ISO 18452
Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)
精细陶瓷（高级陶瓷 高级工业陶瓷）.用接触探针轮廓仪测定陶瓷膜厚度（ISO 18452-2005）
2016-09-01
BS PD ISO/TR 22335-2007
Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
表面化学分析 深度剖面 溅射速率的测量 使用机械触针轮廓仪的网格复制方法
2007-08-31