JB/T 5844-1991
电力半导体器件参数符号
Directional relays and power relays with two input energizing quantities (IEC 60255-12: 1980, NEQ)
1991-10-24
GOST 27299-1987
Приборы полупроводниковые оптоэлектронные. Термины, определения и буквенные обозначения параметров
半导体光电器件 参数的术语 定义和字母符号
JEDEC JEP104C.01
REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES
半导体器件字母符号参考指南
2003-05-01
GB/T 11499-2001
半导体分立器件文字符号
Letter symbols for discrete semiconductor devices
2001-11-05
JJF (电子) 0001-2015
半导体器件动态参数测试系统校准规范
UNE 21321-1978
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
半导体器件和集成微电路的字母符号
1978-06-15
BS IEC 62951-5-2019
Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for thermal characteristics of flexible materials
半导体器件 柔性可伸缩半导体器件
2019-03-05
BS IEC 62951-7-2019
Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件 柔性可伸缩半导体器件
2019-03-06
BS IEC 60747-5-4-2022
Semiconductor devices-Optoelectronic devices. Semiconductor lasers
半导体器件.光电器件 半导体雷射
2022-06-20
BS IEC 62951-6-2019
Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for sheet resistance of flexible conducting films
半导体器件 柔性可伸缩半导体器件
2019-05-15
BS IEC 62951-4-2019
Semiconductor devices. Flexible and stretchable semiconductor devices-Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
半导体器件 柔性可伸缩半导体器件
2019-03-05
BS IEC 62951-2-2019
Semiconductor devices. Flexible and stretchable semiconductor devices-Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
半导体器件 柔性可伸缩半导体器件
2019-04-30
JJF 1895-2021
半导体器件直流和低频参数测试设备校准规范
Calibration Specification for Semiconductor Devices DC and Low Frequency Parameters Test Equipments
2021-02-23
JJG(电子) 310003-2006
半导体分立器件电容参数测试仪检定规程
2006-05-16
JJG(电子) 310002-2006
半导体分立器件直流参数测试仪检定规程
2006-05-16
JJG (电子) 310002-2006
半导体分立器件直流参数测试仪检定规程
Specification for verification of DC parameter testers for semiconductor discrete devices
JJG (电子) 310003-2006
半导体分立器件电容参数测试仪检定规程
Specification for verification of capacitor parameter testers for semiconductor discrete devices
BS EN IEC 60747-16-6-2019
Semiconductor devices-Microwave integrated circuits. Frequency multipliers
半导体器件
2019-09-02
BS IEC 60747-18-2-2020
Semiconductor devices-Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
半导体器件
2020-02-21
BS IEC 60747-5-11-2019
Semiconductor devices-Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
半导体器件
2020-01-14