GOST 24461-1980
Приборы полупроводниковые силовые. Методы измерений и испытаний
功率半导体器件 测试和测量方法
BS EN 60749-34-2010
Semiconductor devices. Mechanical and climatic test methods-Power cycling
半导体器件 机械和气候试验方法
2011-02-28
IEC 60749-34-1-2025
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
半导体器件 机械和气候试验方法 第34-1部分:功率半导体模块的功率循环试验
2025-06-20
BS IEC 62830-5-2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test method for measuring generated power from flexible thermoelectric devices
半导体器件 用于能量收集和发电的半导体器件
2021-02-03
DLS-MIL-STD-750F-2012
Test Methods For Semiconductor Devices
Test Methods For Semiconductor Devices
2012-01-03
MIL MIL-STD-750F Change 1(change incorporated)
Test Methods for Semiconductor Devices
半导体器件的试验方法
2013-04-29
MIL MIL-STD-750F Change 2(all previous changes incorporated)
Test Methods for Semiconductor Devices
半导体器件的试验方法
2016-11-30
MIL MIL-STD-750F
Test Methods for Semiconductor Devices
半导体器件的试验方法
2011-01-03
IEC 62830-5-2021
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
半导体器件.能量收集和产生用半导体器件.第5部分:测量柔性热电器件产生功率的试验方法
2021-01-21
UNE-EN 60749-34-2005
Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling
半导体器件机械和气候试验方法第34部分:功率循环
2005-03-16
KS C IEC 60749-34
반도체 소자－기계 및 기후적 환경 시험 방법－제34부：전력 사이클링
半导体器件机械和气候试验方法第34部分:功率循环
2017-05-30
KS C IEC 60749-34(2022 Confirm)
반도체 소자－기계 및 기후적 환경 시험 방법－제34부：전력 사이클링
半导体器件机械和气候试验方法第34部分:功率循环
2017-05-30
GB/T 4937.34-2024
半导体器件 机械和气候试验方法 第34部分：功率循环
Semiconductor devices—Mechanical and climatic test methods—Part 34:Power cycling
2024-03-15
IEC 60749-34-2010
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
半导体器件 - 机械和气候测试方法 - 第34部分:电力循环
2010-10-28
BS EN 60749-38-2008
Semiconductor devices. Mechanical and climatic test methods-Soft error test method for semiconductor devices with memory
半导体器件 机械和气候试验方法
2008-06-30
BS IEC 62830-8-2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件 用于能量收集和发电的半导体器件
2021-11-04
IEC 60749-38-2008
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
半导体器件 - 机械和气候测试方法 - 第38部分:具有存储器的半导体器件的软错误测试方法
2008-02-12
IEC 62830-8-2021
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件.能量收集和发电用半导体器件.第8部分:低功率电子设备用柔性和可拉伸超级电容器的试验和评估方法
2021-10-22
KS C IEC 60749(2020 Confirm)
반도체 소자－기계 및 기후적 환경 시험 방법
半导体器件机械和气候试验方法
2004-08-13
GOST 28578-1990
Приборы полупроводниковые. Механические и климатические испытания
半导体器件 机械和气候试验方法