GOST 19834.0-1975
Излучатели полупроводниковые. Общие требования при измерении параметров
半导体发射器 参数测量方法 一般原则
GB/T 14030-1992
半导体集成电路时基电路测试方法的基本原理
General principles of measuring methods of timer circuits for semiconductor integrated circuits
1992-12-17
GB/T 6798-1996
半导体集成电路 电压比较器测试方法的基本原理
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
1996-07-09
GB/T 14029-1992
半导体集成电路模拟乘法器测试方法的基本原理
General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
1992-12-17
GB/T 14115-1993
半导体集成电路采样/保持放大器测试方法的基本原理
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
1993-01-21
GB/T 14031-1992
半导体集成电路模拟锁相环测试方法的基本原理
General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
1992-12-17
GB/T 14032-1992
半导体集成电路数字锁相环测试方法的基本原理
General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
1992-12-17
GB/T 14114-1993
半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理
General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
1993-01-21
SJ/T 11702-2018
半导体集成电路 串行外设接口测试方法
Semiconductor integrated circuits Measuring methods for serial peripheral interface
2018-02-09
GOST 22988.0-1978
Счетчики газоразрядные. Общие положения методов измерения параметров
气体计数器特征测量方法一般原则
GOST 18986.0-1974
Диоды полупроводниковые. Методы измерения электрических параметров. Общие положения
半导体二极管 电气参数测量方法 一般要求
SJ/T 2658.1-2015
半导体红外发射二极管测量方法 第1部分：总则
Measuring method for semiconductor infrared-emitting diode - Part 1:General
2015-10-10
GOST 19656.0-1974
Диоды полупроводниковые СВЧ. Методы измерения электрических параметров. Общие положения
半导体UHF二极管 电气参数测量方法 大体情况
SJ 20961-2006
集成电路A/D和D/A转换器测试方法的基本原理
General principles of measuring methods of A/D and D/A converters for integrated circuits
2006-08-07
GOST 21107.0-1975
Приборы газоразрядные. Методы измерения электрических параметров. Общие положения
排气装置 电气参数测量方法 一般原则
GOST 19438.0-1980
Лампы электронные маломощные. Методы измерения параметров. Общие положения
低功率电子管 参数测量方法一般原则
ISO 7077-1981
Measuring methods for building — General principles and procedures for the verification of dimensional compliance
建筑物的测量方法——尺寸符合性验证的一般原则和程序
1981-10-01
BS IEC 62830-5-2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test method for measuring generated power from flexible thermoelectric devices
半导体器件 用于能量收集和发电的半导体器件
2021-02-03
IEC 62830-5-2021
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
半导体器件.能量收集和产生用半导体器件.第5部分:测量柔性热电器件产生功率的试验方法
2021-01-21
BS ISO 20480-3-2021
Fine bubble technology. General principles for usage and measurement of fine bubbles-Methods for generating fine bubbles
精细气泡技术 细气泡使用和测量的一般原则
2021-10-28