SJ/T 10954-1996
电子元器件详细规范 ZCK120型硅开关二极管(可供认证用)
Detail specification for electronic component silicon switching diode for type 2CK120
1996-11-20
BS CECC 90201-1990
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage regulators
电子元件质量评定协调体系规范 空白详细规范:集成电压调节器
1990-07-15
BS CECC 90302-1986
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated voltage comparators
电子元件质量评定协调体系规范 空白详细规范:集成电压比较器
1986-02-15
SJ/T 11226-2000
电子元器件详细规范 3DA505型L波段硅脉冲功率晶体管
Detail specification for electronic components Type 3DA505 L band silicon pulse power transistor
2000-08-16
SJ/T 11227-2000
电子元器件详细规范 3DA98型NPN硅高频大功率晶体管
Detail specification for electronic components Type 3DA98 NPN silicon high-frequency power transistor
2000-08-16
SJ/T 11225-2000
电子元器件详细规范 3DA504型S波段硅脉冲功率晶体管
Detail specification for electronic components Type 3DA504 S band silicon pulse power transistor
2000-08-16
SJ/T 10995-1996
电子元器件详细规范 CT81型高压瓷介电容器 评定水平E(可供认证用)
Detail specification for electronic components High Voltage ceramic capacitors type CT81 Assessment level E
1996-11-20
SJ/T 10994-1996
电子元器件详细规范 CC81型高压瓷介电容器 评定水平E(可供认证用)
Detail specification for electronic components High Voltage ceramic capacitors type CC81 Assessment level E
1996-11-20
BS CECC 90112-1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
电子元件质量评定协调体系规范 空白详细规范 MOS读写动态存储器硅单片电路
1987-08-15
BS CECC 90111-1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits
电子元件质量评定协调体系规范 空白详细规范 MOS读写静态存储器硅单片电路
1987-05-15
DIN 45940-1131
Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/write static memories silicon monolithic circuits
电子元件质量评定协调体系；空白详细规范:MOS读/写静态存储器硅单片电路
1989-02-01
DIN 45940-1132
Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/wirte dynamic memories silicon monolithic circuits
电子元件质量评定协调体系；空白详细规范:MOS读/写动态存储器硅单片电路
1989-02-01
BS CECC 42101-1978
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: low voltage varistors primarily for telephony applications (assessment level P)
电子元件质量评定协调体系规范 空白详细规范:主要用于电话应用的低压压敏电阻器（评定水平P）
1978-11-15
BS CECC 90105-1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fusible link programmable bipolar read only memories, silicon monolithic integrated circuits
电子元件质量评定协调体系规范 空白详细规范:熔丝可编程双极只读存储器硅单片集成电路
1987-05-15
BS QC 750005-1987
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 电压调节器二极管和电压参考二极管 不包括温度补偿精密参考二极管
1987-09-15
BS CECC 90113-1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
电子元件质量评定协调体系规范 空白详细规范 MOS紫外光可擦除电可编程只读存储器硅单片电路
1987-05-15
DIN 45940-1130
Harmonized system of quality assessment for electronic components; blank detail specification: MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
电子元件质量评定协调体系；空白详细规范:MOS紫外光可擦除电可编程只读存储器硅单片电路
1989-02-01