JJD 1016-1991
透射电子显微镜
Verification Regulation of Transmission Electron Microscope
1991-08-01
JJG(教委) 010-1996
分析型扫描电子显微镜检定规程
Verification regulation for analytical scanning electron microscope
1997-01-23
JJG (教委) 010-1996
分析型扫描电子显微镜检定规程
Verification Regulation for analytical scanning electron microscope
JJG 571-2004
读数、测量显微镜检定规程
Verification Regulation of Reading Microscope and Measuring Microscope
2004-09-21
JJG 77-2006
干涉显微镜检定规程
Verification Regulation of Interference Microscope
2006-05-23
JJG (教委) 012-1996
金相显微镜检定规程
Verification regulation for metallographic microscope
JJG(教委) 012-1996
金相显微镜检定规程
Verification regulation for metallographic microscope
1997-01-23
JJG 56-2000
工具显微镜检定规程
Verification Regulation of Universal Measuring Microscopes and Makers Microscopes
2000-05-08
KS D 2716(2018 Confirm)
나노입자 지름 측정방법－투과전자현미경
纳米颗粒直径的测量－透射电子显微镜
2008-12-26
JY/T 0581-2020
透射电子显微镜分析方法通则
General analysis rules for transmission electron microscope
2020-09-29
KS D 2716
나노입자 직경 측정방법 — 투과전자현미경
纳米颗粒直径的测量-透射电子显微镜
2023-06-30
JJG (教委) 013-1996
电子能谱仪检定规程
Verification Regulation for electron spectrometer
GOST R 8.631-2007
Государственная система обеспечения единства измерений. Микроскопы электронные растровые. Методика поверки
确保测量一致性的状态系统 扫描电子显微镜 验证方法
GOST 8.594-2009
Государственная система обеспечения единства измерений. Микроскопы электронные растровые. Методика поверки
确保测量一致性的状态系统 扫描电子显微镜 验证方法
2009-11-11
JJG 901-2005
电子控针分析仪检定规程
Verification Regulation of Electron Probe Microanalyzer
1995-10-19
JJG(京) 40-2008
停车场电子收费计时器检定规程
Verification Regulation of Parking Electronic Timers
2008-08-05
JJD 1017-1991
电子探针仪
Verification Regulation of Electronic Probe Instrument
1991-08-01
BS ISO 25498-2018
Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
微束分析 分析电子显微镜 用透射电子显微镜进行选区电子衍射分析
2018-03-23
GB/T 18907-2013
微束分析 分析电子显微术 透射电镜选区电子衍射分析方法
Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
2013-07-19
ISO 25498-2025
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
微束分析 - 分析电子显微镜 - 使用透射电子显微镜的选择区域电子衍射分析
2025-05-15