多晶体X射线衍射方法通则
General rules for X-ray polycrystalline diffratometry
2020-09-29
JIS Z 4701-1997
General rules for medical X-ray equipment
医用X射线设备通则
1997-01-01
JIS K 0119-2008
General rules for X-ray fluorescence analysis
X射线荧光分析通则
2008-01-01
KS M 0043(2019 Confirm)
X선 회절 분석 통칙
X射线衍射分析的一般规则
2009-11-30
KS M 0043
X선 회절 분석 통칙
X射线衍射分析的一般规则
2024-12-20
BS EN 13925-1-2003
Non-destructive testing. X-ray diffraction from polycrystalline and amorphous materials-General principles
无损检测 多晶和非晶材料的X射线衍射 一般原则
2003-03-20
KS M 0017(2020 Confirm)
X선 형광 분광 광도 분석 방법 통칙
萤光Ｘ射线分析法总则
2010-11-05
KS M 0017(2025 Confirm)
X선 형광 분광 광도 분석 방법 통칙
X射线荧光光谱分析通则
2010-11-05
UNE-EN 13925-1-2006
Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
无损检测.多晶和非晶材料的X射线衍射.第1部分:一般原则
2006-02-08
GB/T 19500-2004
X-射线光电子能谱分析方法通则
General rules for X-ray photoelectron spectroscopic analysis method
2004-04-30
JY/T 0569-2020
波长色散x射线荧光光谱方法通则
General rules for wavelength dispersive X-ray fluoresecence spectrometry
2020-09-29
GB/T 16597-2019
冶金产品分析方法 X射线荧光光谱法通则
Analytical methods of metallurgical products—General rule for X-ray fluorescence spectrometric methods
2019-06-04
GB/T 33352-2016e
电子电气产品中限用物质筛选应用通则 X射线荧光光谱法
General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
2016-12-13
GB/T 33352-2024
电子电气产品中限用物质筛选应用通则 X射线荧光光谱法
General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
2024-04-25
JY/T 0588-2020
单晶X射线衍射仪测定小分子化合物的晶体及分子结构分析方法通则
General rules for crystal and molecular structure determination of small molecules by single crystal X-ray diffractometer
2020-09-29
GB/Z 41476.1-2022
无损检测仪器 1MV以下X射线设备的辐射防护规则 第1部分：通用安全技术要求
Non-destructive testing instruments—Radiation protection rules for the technical application of X-ray equipment up to 1 MV—Part 1:General safety technical requirements