KS A 3602(2017 Confirm)
X선 자진용 인화지의 치수
尺寸X-RAY论文
1976-08-31
MIL MIL-D-36449A Notice 1-Validation
DRIER, X-RAY FILM, PORTABLE (SUPERSEDING MIL-D-36449)
DRIER X-RAY FILM PORTABLE（SUPEREDING MIL-D-36449）
1988-10-31
MIL MIL-H-36203A Notice 1-Cancellation
HANGER, X-RAY FILM, PROCESSING, DENTAL (S/S BY A-A-53579)
HANGER X-RAY FILM PROCESSING DENTAL（S/S BY A-A-53579）
1990-08-10
MIL MIL-G-36479A Notice 1-Cancellation
GLOVES, X-RAY PROTECTIVE (S/S BY A-A-53100) (SUPERSEDING MIL-G-36479)
手套（X-RAY PROTECTIVE）（S/S BY A-A-53100）（取代MIL-G-36479）
1990-05-17
JB/T 11144-2011
X射线衍射仪
X-ray diffractometer
2011-12-20
MIL MIL-D-52842A Notice 1-Cancellation
DRIER, X-RAY, FILM: FORCED AIR, WALL-MOUNTED (NO S/S DOCUMENT) (SUPERSEDING MIL-D-52842)
DRIER X-RAY 电影:强制空气 安装（无S/S文件）（取代MIL-D-52842）
1989-12-27
JB/T 9400-2010
X射线衍射仪 技术条件
Specification of X-ray diffractometer
2010-02-21
KS M ISO 5938(2023 Confirm)
산업용 천연. 인조 크라이올라이트 및 플루오르화 알루미늄 - 황 함량 측정 - X-ray 형광 분광법
工业用天然 人造低温光源和氟化铝-硫含量测定-X-ray荧光光谱法
2003-12-20
JJG 629-2014
多晶X射线衍射仪检定规程
Verification Regulation for Polycrystalline X-Ray Diffractometers
2014-06-15
YB/T 5337-2006
金属点阵常数的测定方法 X射线衍射仪法
The lattice constant determination of metals -- Method of X-ray diffractometer
2006-07-27
JJG (教委) 009-1996
转靶X射线多晶体衍射仪检定规程
Verification Regulation for Rotating Anode X-Ray Polycrystalline Diffractometer
HS/T 12-2006
滑石、绿泥石、菱镁石混合相的定量分析 X射线衍射仪法
Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer
2007-03-28
GB/T 14321-2022
刚玉磨料中α-Al2O3相X射线定量测定方法
Determination method for quantities of α-Al2O3 phase in alumina with an X-ray diffractometer
2022-07-11
YB/T 5336-2006
高速钢中碳化物相的定量分析 X射线衍射仪法
Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
2006-07-27
JY/T 0588-2020
单晶X射线衍射仪测定小分子化合物的晶体及分子结构分析方法通则
General rules for crystal and molecular structure determination of small molecules by single crystal X-ray diffractometer
2020-09-29
GOST R 8.698-2010
Государственная система обеспечения единства измерений. Размерные параметры наночастиц и тонких пленок. Методика выполнения измерений с помощью малоуглового рентгеновского дифрактометра
确保测量一致性的状态系统 纳米颗粒和薄膜的尺寸参数 通过小角度X射线散射衍射仪进行测量的方法