工业镓化学分析方法 杂质元素的测定 电感耦合等离子体质谱法
Methods for chemical analysis industrial gallium—Determination of impurity elements—ICP-MS analytical method
2015-04-30
DIN 50451-7
Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
半导体技术用材料的试验.液体中微量元素的测定.第7部分:用ICP-MS测定高纯度盐酸中的31种元素
2018-04-01
DIN 50451-8-DRAFT
Draft Document - Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
文件草案.半导体技术材料的试验.液体中微量元素的测定.第8部分:用ICP-MS测定高纯度硫酸中的33种元素
2022-01-01
YS/T 34.1-2011
高纯砷化学分析方法 电感耦合等离子体质谱法(ICP-MS)测定 高纯砷中杂质含量
Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic