Диоды полупроводниковые. Методы измерения емкости
半导体二极管 测量电容的方法
SJ/T 2658.4-2015
半导体红外发射二极管测量方法 第4部分：总电容
Measuring method for semiconductor infrared-emitting diode - Part 4:Total capacitance
2015-10-10
SJ/T 2658.14-2016
半导体红外发射二极管测量方法 第14部分：结温
Measuring method for semiconductor infrared-emitting diode - Part 14:Junction temperature
2016-01-15
JEDEC JESD51-14
INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW TROUGH A SINGLE PATH
测量单通道热流半导体器件结-壳热阻的接口试验方法