SJ/T 2215-2015
半导体光电耦合器测试方法
Measuring methods for semiconductor photocouplers
2015-04-30
GB/T 11685-2003
半导体X射线探测器系统和半导体X射线能谱仪的测量方法
Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energyspectrometers
2003-07-07
GOST 19834.0-1975
Излучатели полупроводниковые. Общие требования при измерении параметров
半导体发射器 参数测量方法 一般原则
GOST 18986.0-1974
Диоды полупроводниковые. Методы измерения электрических параметров. Общие положения
半导体二极管 电气参数测量方法 一般要求
GOST R 8.842-2013
Государственная система обеспечения единства измерений. Средства измерений потока излучения полупроводниковых излучающих диодов. Методика поверки
确保测量一致性的状态系统 辐射功率半导体发光二极管测量用途 验证程序
GOST R 8.843-2013
Государственная система обеспечения единства измерений. Средства измерений силы излучения и эффективности полупроводниковых излучающих диодов. Методика поверки
确保测量一致性的状态系统 辐射功率半导体发射二极管的测量功能 验证程序
BS IEC 62830-5-2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test method for measuring generated power from flexible thermoelectric devices
半导体器件 用于能量收集和发电的半导体器件
2021-02-03
SAE J1752/1_202109
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
集成电路的电磁兼容性测量程序 - 集成电路EMC测量程序 - 一般和定义
2021-09-21
GB/T 14029-1992
半导体集成电路模拟乘法器测试方法的基本原理
General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
1992-12-17
GB/T 14030-1992
半导体集成电路时基电路测试方法的基本原理
General principles of measuring methods of timer circuits for semiconductor integrated circuits
1992-12-17
GB/T 6798-1996
半导体集成电路 电压比较器测试方法的基本原理
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
1996-07-09
SJ/T 2658.1-2015
半导体红外发射二极管测量方法 第1部分：总则
Measuring method for semiconductor infrared-emitting diode - Part 1:General
2015-10-10
GOST 19656.0-1974
Диоды полупроводниковые СВЧ. Методы измерения электрических параметров. Общие положения
半导体UHF二极管 电气参数测量方法 大体情况
UNE 73350-1-2003
Procedure for the determination of ambient radioactivity. Measurement equipment. Part 1: Gamma spectrometry by semiconductor sensors.
环境放射性测定程序 测量设备 第1部分:半导体传感器伽马能谱
2003-05-30
UNE 73350-2-2003
Procedure for the determination of ambient radioactivity. Measurement equipment. Part 2: Alpha spectrometry by semiconductor sensors.
环境放射性测定程序 测量设备 第2部分:半导体传感器阿尔法光谱法
2003-12-30
IEC 62830-5-2021
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices
半导体器件.能量收集和产生用半导体器件.第5部分:测量柔性热电器件产生功率的试验方法
2021-01-21
GB/T 14115-1993
半导体集成电路采样/保持放大器测试方法的基本原理
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
1993-01-21
GB/T 14031-1992
半导体集成电路模拟锁相环测试方法的基本原理
General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
1992-12-17
IEEE/ANSI N42.31-2003
American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
美国电离辐射宽带隙半导体探测器分辨率和效率测量程序国家标准
2003-08-20
BS EN 61298-1-2008
Process measurement and control devices. General methods and procedures for evaluating performance-General considerations
过程测量和控制装置 评估绩效的一般方法和程序
2009-10-31