电子薄膜用高纯金属溅射靶材纯度等级及杂质含量分析和报告标准指南
Standard guide for analysis and reporting the impurity content and grade of high purity metallic sputtering targets for electronic thin film applications
2013-10-17
DIN EN 131700
Sectional specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric; German version EN 131700:1997
分规范:带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器；德文版EN 131700:1997
1998-10-01
BS EN 131700-1998
Harmonized system of quality assessment for electronic components. Sectional specification: Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric
电子元件质量评定协调体系 分规范:带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器
1998-02-15
ISO 23170-2022
Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering
表面化学分析.深度剖面.用中能离子散射法对硅衬底上纳米级重金属氧化物薄膜进行无损深度剖面
2022-06-15
DIN EN 131701
Blank detail specification - Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric - Assessment level E; German version EN 131701:1997
空白详细规范.带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器.评定水平E；德文版EN 131701:1997
1998-11-01
DIN EN 131702
Blank detail specification - Fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric - Assessment level EZ; German version EN 131702:1997
空白详细规范.带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器.评定水平EZ；德文版EN 131702:1997
1998-11-01
INCITS 163-1988(R1994)
A Contact Start/Stop Metallic Thin Film Storage Disk, 83,333 Flux Transition PerTrack, 130MM Outer Dia. & 40MM Inner Dia (formerly ANSI X3.163-1988(R1994))
一个接触式启动/停止金属薄膜存储盘 83333磁通转换管 外径130MM内径40MM（原ANSI X3.163-1988（R1994））
1988-01-01
BS EN 131701-1998
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level E
电子元件质量评定协调体系 空白详细规范:带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器 E级评估
1998-02-15
BS EN 131702-1998
Harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric. Assessment level EZ
电子元件质量评定协调体系 空白详细规范:带有薄金属箔和聚碳酸酯膜介质电极的直流固定电容器 评估等级EZ
1998-02-15
AS 2331.1.7-2006
Methods of test for metallic and related coatings, Method 1.7: Local thickness tests - Measurement of dry film thickness of thin coating systems particularly by coil coated products by destructive means using a boring device
金属和相关涂层的试验方法 方法1.7:局部厚度试验-使用钻孔装置通过破坏性方法测量薄涂层系统的干膜厚度 尤其是通过线圈涂层产品
2006-08-14
INCITS 179-1990(R1995)
Contact Start-Stop Metallic Thin-Film Storage Disk - 83 333 Flux Transitions per Track 95-mm (3.740 in) Outer Diameter and 25-mm (0.984 in) Inner Diameter and 1.27-mm (0.050 in) Thickness (formerly ANSI X3.179-1990(R1995))
接触式启停金属薄膜存储盘-每个磁道83 333个磁通量转换 外径95毫米（3.740英寸） 内径25毫米（0.984英寸） 厚度1.27毫米（0.050英寸）（原ANSI X3.179-1990（R1995））