KS A 3602(2017 Confirm)
X선 자진용 인화지의 치수
尺寸X-RAY论文
1976-08-31
MIL MIL-D-36449A Notice 1-Validation
DRIER, X-RAY FILM, PORTABLE (SUPERSEDING MIL-D-36449)
DRIER X-RAY FILM PORTABLE（SUPEREDING MIL-D-36449）
1988-10-31
MIL MIL-H-36203A Notice 1-Cancellation
HANGER, X-RAY FILM, PROCESSING, DENTAL (S/S BY A-A-53579)
HANGER X-RAY FILM PROCESSING DENTAL（S/S BY A-A-53579）
1990-08-10
MIL MIL-G-36479A Notice 1-Cancellation
GLOVES, X-RAY PROTECTIVE (S/S BY A-A-53100) (SUPERSEDING MIL-G-36479)
手套（X-RAY PROTECTIVE）（S/S BY A-A-53100）（取代MIL-G-36479）
1990-05-17
MIL MIL-D-52842A Notice 1-Cancellation
DRIER, X-RAY, FILM: FORCED AIR, WALL-MOUNTED (NO S/S DOCUMENT) (SUPERSEDING MIL-D-52842)
DRIER X-RAY 电影:强制空气 安装（无S/S文件）（取代MIL-D-52842）
1989-12-27
KS M ISO 5938(2023 Confirm)
산업용 천연. 인조 크라이올라이트 및 플루오르화 알루미늄 - 황 함량 측정 - X-ray 형광 분광법
工业用天然 人造低温光源和氟化铝-硫含量测定-X-ray荧光光谱法
2003-12-20
JJG 935-1998
Υ射线厚度计
Verification Regulation of γ-Ray Thickness Gauge
1998-05-12
ECA/EIA CB 13
X-RAY FLUORESCENCE FOR MEASURING PLATING THICKNESS
X射线荧光法测量镀层厚度
1990-09-01
JJF 1306-2011
X射线荧光镀层测厚仪校准规范
Calibration specification for X-ray fluorescence coating thickness instruments
2011-09-14
KS D ISO 3497(2017 Confirm)
도금두께 시험방법-X선 분광광도법
金属涂层 - 涂层厚度的测量 - X射线光谱仪的方法
2002-07-06
BS EN ISO 3497-2001
Metallic coatings. Measurement of coating thickness. X-ray spectrometric methods
金属涂层 涂层厚度的测量 X射线光谱测定法
2001-03-15
KS D ISO 3497(2022 Confirm)
도금두께 시험방법-X선 분광광도법
金属镀层镀层厚度的测量X射线光谱法
2002-07-06
ASTM B568-98(2021)
Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry
通过X射线光谱法测量涂层厚度的标准测试方法
2021-04-01
GB/T 16921-2005
金属覆盖层 覆盖层厚度测量 X射线光谱法
Metallic coatings -- Measurement of coating thickness -- X-ray spectrometric methods
2005-10-12
ISO 3497-2000
Metallic coatings — Measurement of coating thickness — X-ray spectrometric methods
金属涂层——涂层厚度的测量——X射线光谱测定法
2000-12-21
JJF 1133-2005
X射线荧光光谱法黄金含量分析仪校准规范
Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry
2005-04-28
GB/T 34190-2017
电工钢表面涂层的重量（厚度） X射线光谱测试方法
Surface coating weight (thickness) of electrical steel—X-ray spectrometric method
2017-09-07
BS ISO 14701-2018
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
表面化学分析 X射线光电子能谱 氧化硅厚度的测量
2018-11-05
JB/T 12962.3-2016
能量色散X射线荧光光谱仪 第3部分：镀层厚度分析仪
Energy dispersive X-ray fluorescence spectrometer-Part 3: Plating thickness analyzer
2016-10-22
ISO 14701-2018
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
表面化学分析 - X射线光电子能谱 - 氧化硅厚度的测量
2018-10-31