宇航用半导体分立器件通用规范
General specification for discrete semiconductor devices of space application
2023-11-27
BS IEC 60747-10-1991
Semiconductor devices-Generic specification for discrete devices and integrated circuits
半导体器件 分立器件和集成电路总规范
2011-07-31
GOST 28623-1990
Приборы полупроводниковые. Часть 10. Общие технические условия на дискретные приборы и интегральные микросхемы
半导体器件 第10部分分立器件和集成电路的一般规范
GB/T 4589.1-2006
半导体器件 第10部分：分立器件和集成电路总规范
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
2006-10-10
BS CECC 50000-1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
电子元件质量评定协调体系 总规范:分立半导体器件
1987-10-30
DIN EN 153000
Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval); German version EN 153000:1998
总规范:离散压力接触功率半导体器件（资格认证）；德文版EN 153000:1998
1999-01-01
BS EN 153000-1998
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
电子元件质量评定协调体系 总规范:离散压力接触功率半导体器件（资格认证）