现行 GB/T 29506-2013
300mm 硅单晶抛光片 300mm 硅单晶抛光片 300mm polished monocrystalline silicon wafers
发布日期:2013-05-09
实施日期:2014-02-01
分类信息
研制信息

归口单位: 全国半导体设备和材料标准化技术委员会

起草单位: 有研半导体材料股份有限公司、 中国有色金属工业标准计量质量研究所

起草人: 闫志瑞、 孙燕、 盛方毓、 卢立延、 张果虎、 向磊

标准简介

本标准适用于直径300 mm直拉单晶磨削片经双面抛光制备的硅单晶抛光片,产品主要用于满足集成电路IC用线宽90nm技术需求的衬底片

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抛光单晶mm

最后更新时间 2025-09-06