电子元器件结构陶瓷材料的名称和牌号的命名方法
Designation of name and model of structure ceramic materials used in electronic components
1996-11-20
GB/T 5594.8-2015
电子元器件结构陶瓷材料性能测试方法 第8部分：显微结构的测定方法
Test methods for properties of structure ceramic used in electronic components and device—Part 8: Test method for microstructure
2015-05-15
GB/T 5594.7-2015
电子元器件结构陶瓷材料性能测试方法 第7部分：透液性测定方法
Test methods for properties of structure ceramic used in electronic components and device—Part 7: Test method for liquid permeability
2015-05-15
GB/T 5594.1-1985
电子元器件结构陶瓷材料性能测试方法 气密性测试方法
Test methods for properties of structure ceramic used in electronic components--Test method for gas-tightness
1985-11-27
GB/T 5594.5-1985
电子元器件结构陶瓷材料性能测试方法 体积电阻率测试方法
Test methods for properties of structure ceramic used in electronic components--Test method forvolume resistivity
1985-11-27
GB/T 5594.3-2015
电子元器件结构陶瓷材料性能测试方法 第3部分：平均线膨胀系数测试方法
Test methods for properties of structure ceramic used in electronic components and device—Part 3: Test method for mean coefficient of linear expansion
2015-05-15
GB/T 5594.4-2015
电子元器件结构陶瓷材料性能测试方法 第4部分：介电常数和介质损耗角正切值的测试方法
Test methods for properties of structure ceramic used in electronic components and device—Part 4: Test method for permittivity and dielectric loss angle tangent value
2015-05-15
GB/T 5594.2-1985
电子元器件结构陶瓷材料性能测试方法 杨氏弹性模量、泊松比测试方法
Test methods for properties of structure ceramic used in electronic components--Test method for Youngs elastic modulus and Poisson ratio
1985-11-27
GB/T 5594.6-2015
电子元器件结构陶瓷材料性能测试方法 第6部分：化学稳定性测试方法
Test methods for properties of structure ceramics used in eletronic components and device—Part 6: Test method for chemical durability