GB/T 14029-1992
半导体集成电路模拟乘法器测试方法的基本原理
General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
1992-12-17
GB/T 14031-1992
半导体集成电路模拟锁相环测试方法的基本原理
General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
1992-12-17
GB/T 42838-2023
半导体集成电路 霍尔电路测试方法
Semiconductor integrated circuits—Measuring method of Holzer circuit
2023-08-06
SJ/T 10805-2018
半导体集成电路 电压比较器测试方法
Semiconductor integrated circuits Measuring methods for voltage comparators
2018-02-09
GB/T 36477-2018
半导体集成电路 快闪存储器测试方法
Semiconductor integrated circuit—Measuring methods for flash memory
2018-06-07
GB/T 4377-2018
半导体集成电路 电压调整器测试方法
Semiconductor integrated circuits—Measuring method of voltage regulators
2018-03-15
GB/T 35006-2018
半导体集成电路 电平转换器测试方法
Semiconductor integrated circuits—Measuring method of level converter
2018-03-15
GB/T 42970-2023
半导体集成电路 视频编解码电路测试方法
Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
2023-09-07
GB/T 14030-1992
半导体集成电路时基电路测试方法的基本原理
General principles of measuring methods of timer circuits for semiconductor integrated circuits
1992-12-17
SJ/T 11702-2018
半导体集成电路 串行外设接口测试方法
Semiconductor integrated circuits Measuring methods for serial peripheral interface
2018-02-09
GB/T 44924-2024
半导体集成电路 射频发射器/接收器测试方法
Semiconductor integrated circuits—Measuring methods for RF transmitter/receiver
2024-12-31
GB/T 6798-1996
半导体集成电路 电压比较器测试方法的基本原理
Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
1996-07-09
GB/T 35007-2018
半导体集成电路 低电压差分信号电路测试方法
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
2018-03-15
GB/T 14115-1993
半导体集成电路采样/保持放大器测试方法的基本原理
General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
1993-01-21
JEDEC JESD51-1
INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)
集成电路热测量方法电气试验方法（单半导体器件）
1995-12-01
GOST 24613.13-1977
Микросхемы интегральные оптоэлектронные. Метод измерения выходного тока короткого замыкания переключателей логических сигналов
光电集成微电路 测量逻辑信号开关短路的方法
GB/T 14032-1992
半导体集成电路数字锁相环测试方法的基本原理
General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
1992-12-17
KS C IEC 60747-5-3
개별 반도체 소자 및 집적 회로— 제5-3부: 광전 소자 — 측정 방법
分立半导体器件和集成电路 - 第5-3部分:光电器件 - 测量方法
2020-12-24
GB/T 15651.3-2003
半导体分立器件和集成电路 第5-3部分:光电子器件 测试方法
Discrete semiconductor devices and integrated circuits--Part 5-3:Optoelectronic devices--Measuring methods
2003-11-24
GB/T 14114-1993
半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理
General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
1993-01-21