마이크로빔 분석 — 전자 탐침 미소분석 — 파장 분산 엑스선 분광법을 이용한 벌크 시편의 정량 점 분석
微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析
2018-05-23
BS ISO 22489-2016
Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
微束分析 电子探针微量分析 用波长色散X射线光谱法对块状样品进行定量点分析
2016-10-31
KS D ISO 22489(2023 Confirm)
마이크로빔 분석 — 전자 탐침 미소분석 — 파장 분산 엑스선 분광법을 이용한 벌크 시편의 정량 점 분석
微束分析.电子探针微量分析.用波长色散x射线光谱法对大块样品进行定量点分析
2018-05-23
GB/T 28634-2012
微束分析 电子探针显微分析 块状试样波谱法定量点分析
Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
2012-07-31
ISO 22489-2016
Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
微束分析 - 电子探针微量分析 - 使用波长色散X射线光谱法的批量样品的定量点分析
2016-10-20
BS ISO 23692-2021
Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
微束分析 电子探针微量分析 连铸钢中锰枝晶偏析的定量分析
2021-04-20
ISO 23692-2021
Microbeam analysis — Electron probe microanalysis — Quantitative analysis of Mn dendritic segregation in continuously cast steel product
微束分析-电子探针显微分析-连铸钢产品中锰枝晶偏析的定量分析
2021-04-09
BS ISO 17470-2014
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
微束分析 电子探针微量分析 波长色散X射线光谱法定性点分析指南
2014-01-31
ISO 17470-2014
Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
微束分析——电子探针微量分析——波长色散X射线光谱法定性点分析指南