硅外延层厚度测定 堆垛层错尺寸法
Test method for thickness of epitaxial layers—Stacking fault size
2016-04-05
GB/T 42905-2023
碳化硅外延层厚度的测试 红外反射法
Test method for thickness of silicon carbide epitaxial layer—Infrared reflectance method
2023-08-06
YS/T 24-2016
外延钉缺陷的检验方法
Test methods for spike of epitaxial layers
2016-04-05
YS/T 14-2015
异质外延层和硅多晶层厚度的测量方法
Test method for thickness of heteroepitaxy layers and polycrystalline layers
2015-04-30
GB/T 30654-2014
Ⅲ族氮化物外延片晶格常数测试方法
Test method for lattice constant of III-nitride epitaxial layers
2014-12-31
GB/T 30653-2014
Ⅲ族氮化物外延片结晶质量测试方法
Test method for crystal quality of III-nitride epitaxial layers
2014-12-31
GB/T 14141-2009
硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
2009-10-30
GB/T 30655-2014
氮化物LED外延片内量子效率测试方法
Test methods for internal quantum efficiency of nitride LED epitaxial layers
2014-12-31
GB/T 14142-2017
硅外延层晶体完整性检验方法 腐蚀法
Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique
2017-09-29
GB/T 14146-2021
硅外延层载流子浓度的测试 电容-电压法
Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method
2021-05-21
GB/T 14847-2010
重掺杂衬底上轻掺杂硅外延层厚度的红外反射测量方法
Test mothod for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance
2011-01-10
BS 3424-25-1993
Testing coated fabrics-Method 28. Method for determination of the coating thickness and thickness of any expanded layer
测试涂层织物
1993-05-15
ASTM F387-17(2022)
Standard Test Method for Measuring Thickness of Resilient Floor Covering With Foam Layer
测量有泡沫层的弹性地板覆盖物厚度的标准试验方法
2022-06-01
ASTM F410-08(2022)
Standard Test Method for Wear Layer Thickness of Resilient Floor Coverings by Optical Measurement
用光学测量法测定弹性地板覆盖物磨损层厚度的标准试验方法
2022-10-01
ASTM D4748-10(2020)
Standard Test Method for Determining the Thickness of Bound Pavement Layers Using Short-Pulse Radar
使用短脉冲雷达确定结合路面层厚度的标准测试方法
2020-11-01
JB/T 10534-2005
多层镍镀层 各层厚度和电化学电位 同步测定法
Standard test method for simultaneous thickness and electrochemical potential determination of individual layers multilayer nickel deposit
2005-09-23
ASTM B764-04(2021)
Standard Test Method for Simultaneous Thickness and Electrode Potential Determination of Individual Layers in Multilayer Nickel Deposit (STEP Test)
多层镍镀层中单层厚度和电极电位同时测定的标准试验方法（步进试验）
2021-04-01
GB/T 40128-2021
表面化学分析 原子力显微术 二硫化钼片层材料厚度测量方法
Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets